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Technique
Discipline
Photon Energy Range
Keyword







Phase-I Beamlines

Port: 05A

Source: IU22

Energy Range: 5.7–20 keV

Focused Spot Size: 65 x 36 μm² (H x V)

Status: operational

Techniques:
  • Large unit-cell crystallography
  • Microcrystallography
  • High throughput crystallography
  • 0.7–2 Å MAD/SAD phasing
  • Protein crystallography
  • Macromolecular crystallography
  • Biological crystallography
  • Protein microcrystallography
Disciplines:
  • Structural biology
  • Biochemistry
  • Structural genomics
  • Medicine and drug discovery

Port: 09A

Source: IU22

Energy Range: 5.6-25 keV for DCM

Focused Spot Size: 600 x 700 μm² (H x V)

Status: operational

Techniques:
  • Time-resolved X-ray scattering
  • Pump probe X-ray diffraction
  • High resolution powder X-ray diffraction
  • In-situ powder X-ray diffraction
Disciplines:
  • Materials science
  • Structural dynamics of matter
  • X-ray optics
  • Powder crystallography

Port: 21A

Source: IUT22-3m

Energy Range: 5-30 keV (white-beam), 7-25 keV (mono-beam)

Focused Spot Size: 80 x 80 nm² (lateral); 40 nm (depth)

Status: operational

Techniques:
  • 2D/3D X-ray Laue diffraction
  • Nano X-ray fluorescence
  • Qudraprobe; SEM; SPM
  • Nano X-ray absorption fine structures (XAFS)
  • Nano X-ray excited optical luminescence (XEOL)
  • Nano projection X-ray microscopy (PXM)
  • Scanning electron microscopy (SEM)
  • Cathode luminescence (CL)
  • Scanning Probe Microscopy
Disciplines:
  • Materials science
  • Environment and energy related research
  • High pressure physics
  • Physics
  • Nanomaterials
  • Semiconductor devices
  • Energy materials
  • Geoscience
  • Nanotechnology
  • Condensed matter physics
  • Functional materials
  • Photovoltaic materials

Port: 23A

Source: IU22

Energy Range: 4-15 KeV

Focused Spot Size: 40 nm @ 10 keV

Status: under construction

Techniques:
  • Nano X-ray fluorescence (XRF)
  • Nano X-ray absorption fine structures (XAFS)
  • Nano X-ray excited optical luminescence (XEOL)
  • Nano projection X-ray microscopy (PXM)
  • Coherent X-ray diffraction imaging (CXDI)
  • Bragg-ptychography
  • Scanning electron microscopy (SEM)
  • Cathode luminescence (CL)
  • On-the-fly scanning
Disciplines:
  • Materials science
  • Physics
  • Nanomaterials
  • Semiconductor devices
  • Energy materials
  • Geoscience
  • Chemistry
  • Biomedical Engineering

Port: 25A

Source: IU22

Energy Range: 5.5-20 keV

Focused Spot Size: 1 x 1 μm² or 10 x 10 μm²

Status: operational

Techniques:
  • Coherent Diffraction Imaging (CDI)
  • X-ray Photon Correlation Spectroscopy (XPCS)
  • Small Angle X-ray Scattering (SAXS)
Disciplines:
  • Materials science
  • Polymer and soft matter
  • Nanotechnology

Port: 41A

Source: Tandem EPU48

Energy Range: 400 - 1200 eV

Focused Spot Size: Smallest beam size: 5 x 5 μm² (H x V)

Status: commissioning

Techniques:
  • RIXS
  • Bragg CDI
  • Ptychography
  • Resonant soft X-ray scattering
  • Soft X-ray absorption
Disciplines:
  • Condensed matter physics
  • Electronic excitations of strongly correlated electron systems
  • Functional materials
  • Spin, charge and orbital ordering
  • Soft X-ray imaging

Port: 45A

Source: EPU46

Energy Range: 280-1500 eV

Focused Spot Size: 1.2 × 0.4 μm² (H x V)

Status: under construction

Techniques:
  • X-ray excited optical luminescence
  • Angular/spinresolved photoemission
  • X-ray emission
  • X-ray absorption
  • Magnetic circular dichroism
Disciplines:
  • Topological insulators / metals / superconductors
  • Carbon-related systems and nanomaterials
  • Photovoltaic materials
  • Electron-correlated materials
  • Magnetic materials





National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076

+886-3-578-0281