21A X-ray Nanodiffraction

XND

Summary of Techniques

The FORMOSA end-station provided following techniques for users.

  • 2D/3D scanning Laue diffraction
  • Nano-beam X-ray Flourescence Mapping
  • Nano-beam X-ray Absorption Spectroscopy/Imaging
  • Projection X-ray Microscopy/Imaging (PXM)
  • X-ray Excited Optical Luminescence
  • In-situ SPM tetra-probes for electrical, optical, mechical and surface measurements
  • On-line SEM system for quick sample positioning and probes navigation

The summary of techniques of FORMOSA as shown in below;

2D Laue Diffraction

FORMOSA equipped with large area hybird pixel array (PAD) detector on the top of sample stage to collect Laue diffraction pattern. Combined with precise scanner, users can probing the variation of crystal or thin film to obtained a series of Laue patterns . After obtained the patterns, we can adopt specific software (ex. XMAS, LaueTools, LaueGo...etc) to analyize the patterns and extract useful information of crystal, such as phases, orientations, dislocation density, strain and stress.

Laue diffraction pattern from Si (111) crystal

Si (111) Laue pattern indexed by XMAS software

3D Laue Diffraction (DAXM)

In order to study the crystal properties of real materials, FORMOSA also provided 3D Laue diffraction.

Projection X-ray Microscopy (PXM)

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Nanobeam X-ray Fluorescence (nano-XRF)

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Nanobeam X-ray Absorption (nano-XAS)

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Nanobeam X-ray Excited Optical Luminescence (nano-XEOL)

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In-situ Scanning Probe Microscopy

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Techniques

Publications

User Activities

Beamline Information

2018 XMAS Workshop

2017 XMAS Workshop

Gallery


 Contacts

Endstation

Ext. 2211

BL Spokesperson

—Ching-Shun Ku (古慶順)
csku@nsrrc.org.tw
Ext. 7119

BL Local Contact/Manager

—Shang-Jui Chiu (邱上睿)
chiu.sj@nsrrc.org.tw
Ext. 7128


Techniques

  • 2D/3D X-ray Laue diffraction
  • Nano X-ray fluorescence
  • Qudraprobe; SEM; SPM
  • Nano X-ray absorption fine structures (XAFS)
  • Nano X-ray excited optical luminescence (XEOL)
  • Nano projection X-ray microscopy (PXM)
  • Scanning electron microscopy (SEM)
  • Cathode luminescence (CL)
  • Scanning Probe Microscopy

Disciplines

  • Materials science
  • Environment and energy related research
  • High pressure physics
  • Physics
  • Nanomaterials
  • Semiconductor devices
  • Energy materials
  • Geoscience
  • Nanotechnology
  • Condensed matter physics
  • Functional materials
  • Photovoltaic materials

General Information

  • Source: 21A
  • Energy Range: 5-30 keV (white-beam), 7-25 keV (mono-beam)
  • Focused Spot Size: 80 x 80 nm² (lateral); 40 nm (depth)
  • Status: operational







National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076

+886-3-578-0281