21A X-ray Nanodiffraction

XND

Beamtime Requirement for XND

Find a Beamline

21A Home

Specifications

Endstations

Staff

BL Schedule

Optical Layout

Techniques

Publications

User Activities

Beamline Information

2018 XMAS Workshop

2017 XMAS Workshop

Gallery


 Contacts

Endstation

Ext. 2211

BL Spokesperson

—Ching-Shun Ku (古慶順)
csku@nsrrc.org.tw
Ext. 7119

BL Local Contact/Manager

—Shang-Jui Chiu (邱上睿)
chiu.sj@nsrrc.org.tw
Ext. 7128


Techniques

  • 2D/3D X-ray Laue diffraction
  • Nano X-ray fluorescence
  • Qudraprobe; SEM; SPM
  • Nano X-ray absorption fine structures (XAFS)
  • Nano X-ray excited optical luminescence (XEOL)
  • Nano projection X-ray microscopy (PXM)
  • Scanning electron microscopy (SEM)
  • Cathode luminescence (CL)
  • Scanning Probe Microscopy

Disciplines

  • Materials science
  • Environment and energy related research
  • High pressure physics
  • Physics
  • Nanomaterials
  • Semiconductor devices
  • Energy materials
  • Geoscience
  • Nanotechnology
  • Condensed matter physics
  • Functional materials
  • Photovoltaic materials

General Information

  • Source: 21A
  • Energy Range: 5-30 keV (white-beam), 7-25 keV (mono-beam)
  • Focused Spot Size: 80 x 80 nm² (lateral); 40 nm (depth)
  • Status: operational







National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076

+886-3-578-0281