27A Nanoscopy

STXMPRINS
Major techniquesSTXM, XAS, PtychographyXPEEM, k-PEEM, XPS-imaging, PES
Spot size30 nm x 30 nm10 μm x 10 μm
Image spatial resolution30 nm (STXM) / 4 nm (Pty)80 nm (SR) / 50 nm (UV)
k-space resolutionN.A.0.025 Å-1
Electron energy resolutionN.A.50 meV (SR) / 30 meV (UV)
Probingphotonsphotoelectrons / secondary electrons
Measuring typescanningfull-field



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27A Home

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Techniques

  • Soft X-ray imaging
  • Scanning transmission X-ray microscopy
  • Soft X-ray ptychography
  • Photoelectron microscopy

Disciplines

  • Materials science
  • Environment and energy related research
  • Physics
  • Nanomaterials
  • Chemistry
  • Functional materials
  • Soft X-ray imaging
  • Carbon-related systems and nanomaterials
  • Photovoltaic materials
  • Magnetic materials
  • Low dimension materials

General Information

  • Source: 27A
  • Energy Range: 90-2500 (Linear Polarization), 90-1200 (Circular Polarization)
  • Focused Spot Size: 30 x 30 nm² @STXM, 10 x 10 μm² @PRINS
  • Status: under design, to be constructed







National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076

+886-3-578-0281