21A X-ray Nanodiffraction

XND

Scientific Scope

This beamline offer 2D/3D Laue diffraction with sub-100 nm spatial resolution to characterized the local deformation, stress and strain partitioning, fatigue, grain growth, recrystallization, and texture development of heterogeneous materials such as soils, minerals, composites or alloys.

Beamline Description

The beamline is dedicated to white/mono-beam Laue diffraction for structural analysis. For instance, users could obtain the 2D and 3D distribution of phases, orientation, residual strain, stress, and dislocations for materials in a complex form without destructing the samples during measurement. The estimated spatial resolution could be better than 100 x 100 x 50 nm. Furthermore, this end-station provided many complementary tools. Tetra-probe stages collect optical, electrical, surface properties of specimens; the fluorescence detector provides elemental information and the cryo-stage integrated with heater for temperature dependence experiments. Particularly, it is also the first time in synchrotron history to integrate an online real-time scanning electron microscopy (SEM) as a navigator. With spatial resolution down to 4 nm, it is able to find out the interest region with tiny structure on samples and arrange the position for different probes. This end-station can function either in vacuum or ambient environments depending on the user’s demands. The station mounts an adjustment structure and settles on an active vibration cancellation optical table which minimizes the vibration level. In summary, this beamline and end-station will provide not only 2D/3D-XRD but also XRF, XAS, XEOL/CL, SPM and SEM information for diverse research programs.

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2017 XMAS Workshop

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 Contacts

Endstation

Ext. 2211

BL Spokesperson

—Ching-Shun Ku (古慶順)
csku@nsrrc.org.tw
Ext. 7119

BL Local Contact/Manager

—Shang-Jui Chiu (邱上睿)
chiu.sj@nsrrc.org.tw
Ext. 7128


Techniques

  • 2D/3D X-ray Laue diffraction
  • Nano X-ray fluorescence
  • Qudraprobe; SEM; SPM
  • Nano X-ray absorption fine structures (XAFS)
  • Nano X-ray excited optical luminescence (XEOL)
  • Nano projection X-ray microscopy (PXM)
  • Scanning electron microscopy (SEM)
  • Cathode luminescence (CL)
  • Scanning Probe Microscopy

Disciplines

  • Materials science
  • Environment and energy related research
  • High pressure physics
  • Physics
  • Nanomaterials
  • Semiconductor devices
  • Energy materials
  • Geoscience
  • Nanotechnology
  • Condensed matter physics
  • Functional materials
  • Photovoltaic materials

General Information

  • Source: 21A
  • Energy Range: 5-30 keV (white-beam), 7-25 keV (mono-beam)
  • Focused Spot Size: 80 x 80 nm² (lateral); 40 nm (depth)
  • Status: operational







National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076

+886-3-578-0281