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Port: 05A

Source: IU22

Energy Range: 5.7–20 keV

Focused Spot Size: 65 x 36 μm² (H x V)

Status: operational

Techniques:

• Large unit-cell crystallography
• Microcrystallography
• High throughput crystallography
• 0.7–2 Å MAD/SAD phasing
• Protein crystallography
• Macromolecular crystallography
• Biological crystallography
• Protein microcrystallography

Disciplines:

• Structural biology
• Biochemistry
• Structural genomics
• Medicine and drug discovery

05A
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Port: 09A

Source: IU22

Energy Range: 5.6-25 keV for DCM

Focused Spot Size: 600 x 700 μm² (H x V)

Status: operational

Techniques:

• Grazing incidence diffraction
• Crystal truncation rods
• Reciprocal space map
• X-ray reflectivity
• Resonant hard X-ray scattering
• Pump/probe (X-ray diffraction) in tens of ps to ms range
• General diffraction

Disciplines:

• Materials science
• Structural dynamics of matter
• X-ray optics

09A
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Port: 21A

Source: IUT22-3m

Energy Range: 5-30 keV (white-beam), 7-25 keV (mono-beam)

Focused Spot Size: 80 x 80 nm² (lateral); 40 nm (depth)

Status: operational

Techniques:

• 2D/3D X-ray Laue diffraction
• Nano X-ray fluorescence
• Qudraprobe; SEM; SPM
• Nano X-ray absorption fine structures (XAFS)
• Nano X-ray excited optical luminescence (XEOL)
• Nano projection X-ray microscopy (PXM)
• Scanning electron microscopy (SEM)
• Cathode luminescence (CL)
• Scanning Probe Microscopy

Disciplines:

• Materials science
• Environment and energy related research
• High pressure physics
• Physics
• Nanomaterials
• Semiconductor devices
• Energy materials
• Geoscience
• Nanotechnology
• Condensed matter physics
• Functional materials
• Photovoltaic materials

21A
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Port: 23A

Source: IU22

Energy Range: 4-15 KeV

Focused Spot Size: 40 nm @ 10 keV

Status: under construction

Techniques:

• Nano X-ray fluorescence (XRF)
• Nano X-ray absorption fine structures (XAFS)
• Nano X-ray excited optical luminescence (XEOL)
• Nano projection X-ray microscopy (PXM)
• Coherent X-ray diffraction imaging (CXDI)
• Bragg-ptychography
• Scanning electron microscopy (SEM)
• Cathode luminescence (CL)
• On-the-fly scanning

Disciplines:

• Materials science
• Physics
• Nanomaterials
• Semiconductor devices
• Energy materials
• Geoscience
• Chemistry
• Biomedical Engineering

23A
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Port: 25A

Source: IU22

Energy Range: 5.5-20 keV

Focused Spot Size: 1 x 1 μm² or 10 x 10 μm²

Status: operational

Techniques:

• Coherent Diffraction Imaging (CDI)
• X-ray Photon Correlation Spectroscopy (XPCS)
• Small Angle X-ray Scattering (SAXS)

Disciplines:

• Materials science
• Polymer and soft matter
• Nanotechnology

25A
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Port: 41A

Source: Tandem EPU48

Energy Range: 400 - 1200 eV

Focused Spot Size: Smallest beam size: 5 x 5 μm² (H x V)

Status: commissioning

Techniques:

• RIXS
• Bragg CDI
• Ptychography
• Resonant soft X-ray scattering
• Soft X-ray absorption

Disciplines:

• Condensed matter physics
• Electronic excitations of strongly correlated electron systems
• Functional materials
• Spin, charge and orbital ordering
• Soft X-ray imaging

41A
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Port: 45A

Source: EPU46

Energy Range: 280-1500 eV

Focused Spot Size: 2.5 × 1.5 μm² (H x V)

Status: operational

Techniques:

• Soft X-ray absorption
• Angle-Resolved PhotoEmission Spectroscopy

Disciplines:

• Topological insulators / metals / superconductors
• Carbon-related systems and nanomaterials
• Photovoltaic materials
• Electron-correlated materials
• Magnetic materials

45A
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