X-ray microscopy is under a rapid growth along with the increased availability on high brightness synchrotron facilities around the world. Nowadays, soft X-ray imaging methods have evolved into three general types:
(i) scanning imaging; the X-ray is focused through optical elements (zone plate or KB mirror) to form a nanoprobe, and an image is recorded via raster scanning the nanosized probe across desired area,
(ii) full-field imaging; either X-ray optics or electron column is used to magnify signals emitted from regions illuminated with X-ray,
(iii) lensless imaging; scattered signals from far-eld coherent X-ray illumination is recorded and inverted back into real space images.
We intend to pursue all three approaches at Nanoscpy beamline.

TPS 27A beamline is powered by an elliptically polarized undulator (EPU) with magnets at a 66 mm period length, and photons are monochromized by active gratings to cover an energy window of 90 to 2200 eV at a resolving power of 10,000. The beamline is to host two microscopes in separated branches.
At the first branch, it sits a zone-plate-based scanning transmission X-ray microscope (STXM) developed jointly with Prof. Way-faung Peng at Tamkang University.  The STXM is capable of recording absorption-based images as well as coherent diffraction images (ptychography).
The second branch is to host a photoelectron related imaging and nanospectroscopy (PRINS) station. With an imaging type electron column integrated with a double hemispherical electron energy analyzer, the microscope at PRINS station is an energy-compensated full-field microscope capable of collecting photoelectrons in either real-space or momentum-space mode.
With the capabilities described above, the Nanoscopy beamline is expected to attract a broad range of domestic and international users whose expertise includes environment, energy, polymer, magnetism, semiconductor, and low-dimensional physics and chemistry.