The beamline is dedicated to white/mono-beam Laue diffraction for structural analysis. For instance, users could obtain the 2D and 3D distribution of phases, orientation, residual strain, stress, and dislocations for materials in a complex form without destroying the samples during measurement. The estimated spatial resolution could be better than 100 x 100 x 50 nm. Furthermore, this end-station provided many complementary tools. Tetra-probe stages collect optical, electrical, and surface properties of specimens; the fluorescence detector provides elemental information, and the cryo-stage is integrated with the heater for temperature dependence experiments. Particularly, it is also the first time in synchrotron history to integrate an online real-time scanning electron microscopy (SEM) as a navigator to find out the interest region with tiny structures on samples and arrange the position for different probes. Depending on the user's demands, This end-station can function in vacuum or ambient environments. The station mounts an adjustment structure and settles on an active vibration cancellation optical table which minimizes the vibration level. In summary, this beamline and end-station will provide not only 2D/3D-XRD but also XRF, XAS, XEOL/CL, SPM, and SEM information for diverse research programs.