- Integrated beam shaping: 5 to 50 μm beam, user selectable
- Changeable beam divergence: 0.1 to 0.5 mrad divergence, user selectable
- On-axis sample video: parallax error-free and real time imaging
- High precision PHI axis: < 1 μm SOC, suitable for microdiffraction
- Maximum PHI rotation speed up to 130 deg/s: suitable for inverse-beam experiments
- High-speed and large-size area detector: suitable for shutterless fine-slicing data collection
- Grid scan: find the best diffracting area
- Helical scan: mitigate the radiation damage
- Automatic sample changer: enable high throughput crystal screening
- Remote access capability: save money and time
05A experiment control area
Experimetal station
Micro-diffractometer ARINAX MD2
Close view of sample sourounding
High speed CCD area detector Rayonix MX300HS
Automatic sample changer SAM
Computing system
