The nanoprobe endstation provides a large collection of X-ray techniques, namely, X-ray absorption fine structures (XAFS), X-ray fluorescence (XRF), X-ray excited optical luminescence (XEOL), projection X-ray microscope (PXM). All these are with 40 nm spatial resolution. This endstation also aims for even higher resolution beyond the diffraction limit of the focusing optics by adapting coherent X-ray diffraction imaging (CDI) and Bragg-ptychography. Powerful supporting systems are equipped into the endstation. To name a few, a scanning electron microscope (SEM) can quickly locate the sample position and also serves as an electron source for imaging and cathode luminescence; a multi-axis laser interferometer system in cooperation with ultrahigh precision translational stages for monitoring on-the fly-scanning; a load lock system for quickly transferring as well as triggering sample growth; a helium cryo-cooling system for sample environment as low as 10 K. The Montel optics is stationed in high vacuum (1 x 10-6 torr) chamber with a precise controlled temperature ±0.02 K in 48 hours.
Appearance of experimental main chamber
Mirrorholder (left) , Montel mirrors (medium) and Mirrors in main chamber (right)
Sample load-lock chamber (left) and sample load-lock rod (right)
Scanning electron Microscope (SEM)
X-ray excited optical luminescence (XEOL) system
Interlock control system of vacuity and turbopump rotation velocity
Laser interferometer system