27A　Soft X-ray Nanoscopy

Endstation-3

	STXM	PRINS
Major techniques	STXM, XAS, Ptychography	XPEEM, k-PEEM, XPS-imaging, PES
Spot size	30 nm x 30 nm	10 μm x 10 μm
Image spatial resolution	30 nm (STXM) / 4 nm (Pty)	80 nm (SR) / 50 nm (UV)
k-space resolution	N.A.	0.025 Å^-1
Electron energy resolution	N.A.	50 meV (SR) / 30 meV (UV)
Probing	photons	photoelectrons / secondary electrons
Measuring type	scanning	full-field

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BL-Specifications

Contacts

Endstation

+886(0)-3-578-0281

(27A1) Ext. 2271

(27A2) Ext. 2272

BL Spokesperson

Wei, Der-Hsin (魏德新)
dhw@nsrrc.org.tw
Ext. 8307 / 7312

Hsu, Yao-Jane (許瑤真)
yjhsu@nsrrc.org.tw
Ext. 8305 / 7311

BL Manager/Local Contact

Shiu, Hung-Wei (許紘瑋)
hwshiu@nsrrc.org.tw
Ext. 7119

Chuang, Tzu-Hung (莊子弘)
chuang.th@nsrrc.org.tw
Ext. 2272 / 7350

Techniques

Angle-Resolved PhotoEmission Spectroscopy
Soft X-ray imaging
Scanning transmission X-ray microscopy
Soft X-ray ptychography
Photoelectron microscopy
Momentum microscopy
X-ray absorption Spectroscopy (XAS)

Disciplines

Materials science
Environment and energy related research
Physics
Nanomaterials
Chemistry
Functional materials
Soft X-ray imaging
Carbon-related systems and nanomaterials
Photovoltaic materials
Magnetic materials
Low dimension materials

General Information

Source: EPU66
Energy Range: 90-2500 (Linear Polarization), 90-1200 (Circular Polarization)
Focused Spot Size: 30 x 30 nm² @STXM, 10 x 10 μm² @PRINS
Status: commissioning