32A　Tender X-ray Absorption Spectroscopy Beamline

TXAS

EXPERIMENTAL TECHNIQUES

X-ray absorption spectroscopy (XAS)
Hard X-ray photoelectron spectroscopy (HAXPES)
Micro-X-ray fluorescent spectroscopy (µ-XRF) and μ-XAS

ENDSTATION

Beamline Controls and Data Acquisition EPICS-based beamline control system with LabVIEW data acquisition software run in a Windows operating system.

Detectors

- Grid ion chamber

- Multi-channel silicon drift detectors (SDD)

-Electron energy analyzer operating in Ultra high vacuum (UHV) system ( <10^-9 Torr).

Additional Equipment

- Raman spectroscopy instruments

- In-situ heating stage (1000 ^oC)

- In-situ cooling stage (10 K)

- Gas chromatography/Mass spectrometer

- High-performance liquid chromatography

- Electrochemistry analyzer

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Techniques: Tender X-ray Photoelectron Spectroscopy (TXPS, 1.7~6 keV)

Techniques

X-ray absorption Spectroscopy (XAS)
X-ray absorption fine structures Spectroscopy (XAFS)
Micro X-ray Fluoreccence Microscopy (μXFM)

Disciplines

Materials science
Environment and energy related research
Physics
Nanomaterials
Energy materials
Geoscience
Chemistry
Nanotechnology
Condensed matter physics
Electronic excitations of strongly correlated electron systems
Functional materials
Photovoltaic materials
Electron-correlated materials
Low dimension materials

General Information

Source: 1.7-11keV
Energy Range: 0.3*0.62 mm2 (Micro-beam: 5*5 μm2)
Focused Spot Size: 0.3*0.62 mm2 (Micro-beam: 5*5 μm2)
Status: Under Construction