32A　Tender X-ray Absorption Spectroscopy Beamline

TXAS

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Techniques: Tender X-ray Photoelectron Spectroscopy (TXPS, 1.7~6 keV)

Techniques

X-ray absorption Spectroscopy (XAS)
X-ray absorption fine structures Spectroscopy (XAFS)
Micro X-ray Fluoreccence Microscopy (μXFM)

Disciplines

Materials science
Environment and energy related research
Physics
Nanomaterials
Energy materials
Geoscience
Chemistry
Nanotechnology
Condensed matter physics
Electronic excitations of strongly correlated electron systems
Functional materials
Photovoltaic materials
Electron-correlated materials
Low dimension materials

General Information

Source: 1.7-11keV
Energy Range: 0.3*0.62 mm2 (Micro-beam: 5*5 μm2)
Focused Spot Size: 0.3*0.62 mm2 (Micro-beam: 5*5 μm2)
Status: Under Construction