21A　X-ray Nanodiffraction

XND

Workshop on Data Collection and Analysis of X-ray Nanodiffraction

Panel content

Presentation Slides

Dr. Nobumichi Tamura

Prof. Kai Chen

Certificate

Liscence of XND

1.

2.

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User Activities

Beamline Information

2018 XMAS Workshop

2017 XMAS Workshop

Contacts

Endstation

Ext. 2211

BL Spokesperson

Ching-Yu Chiang (蔣慶有)
chiang.cy@nsrrc.org.tw
Ext. 2211

BL Local Contact/Manager

Wan-Zhen Hsieh (謝宛蓁)
hsieh.wz@nsrrc.org.tw
Ext. 2211

Techniques

2D/3D X-ray Laue diffraction
Nano X-ray fluorescence
Qudraprobe; SEM; SPM
Nano X-ray absorption fine structures (XAFS)
Nano X-ray excited optical luminescence (XEOL)
Nano projection X-ray microscopy (PXM)
Scanning electron microscopy (SEM)
Cathode luminescence (CL)
Scanning Probe Microscopy

Disciplines

Materials science
Environment and energy related research
High pressure physics
Physics
Nanomaterials
Semiconductor devices
Energy materials
Geoscience
Nanotechnology
Condensed matter physics
Functional materials
Photovoltaic materials

General Information

Source: IUT22-3m
Energy Range: 5-30 keV (white-beam), 7-25 keV (mono-beam)
Focused Spot Size: 80 x 80 nm² (lateral); 40 nm (depth)
Status: operational