32A Tender X-ray Absorption Spectroscopy Beamline


Beamline Description

A new tender X-ray absorption spectroscopy beamline (TPS 32A) has brought high-brightness beam performance using the bending magnet (BM). The back-to-back water-cooled double crystals monochromators (DCMs, Si (111) and InSb (111)) can cover the unique photon energy range from 1.7 to 11 keV (often called “tender X-ray” and somewhat higher). The simulated focus beam size is 0.6 × 0.3 mm2 (h × v, FWHM) via the Si(111) DCM at 4keV with the photon flux is ~1012 phs/s. This photon energy range covers the K-edges of elements from Si to Zn, L-edges of the second-row transition metals (4d elements) and the lanthanides (4f elements), and the M-edge of part of 5d elements. The spectroscopies experiments on this beamline will provide information on the electronic and atomic structure of the scientific applications.

Scientific Scope

TPS 32A beamline is suitable for application to various scientific fields, including physics, chemistry, materials science, chemical engineering, geology, earth, biology, and environmental sciences. The X-ray absorption spectroscopy (XAS) technique is routinely employed to probe the electronic and atomic structures of specific elements in materials. The detection limit of the multi-sensor fluorescence silicon drift detector (SDD) may reach around monolayer (a few ppm) levels. On the other hand, configured hard X-ray photoelectron spectroscopy (HAXPES) technique using a high-quality electron energy analyzer can probe properties in deeper layers of the samples and access core-level electrons. Micro-XAS will also be available with ~5 μm spatial resolution in the endstation. Various furnaces, cryostats, and in-situ cells for different sample environments will be available on request. All the efforts are to provide diversified and user-friendly experimental conditions and environments to maximize the scientific output.

X-ray Absorption Edges of Measurable Elements at TPS 32A 

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Optical Layout




 Techniques:  Tender X-ray Photoelectron Spectroscopy (TXPS, 1.7~6 keV) 



  • X-ray absorption Spectroscopy (XAS)
  • X-ray absorption fine structures Spectroscopy (XAFS)
  • Micro X-ray Fluoreccence Microscopy (μXFM)


  • Materials science
  • Environment and energy related research
  • Physics
  • Nanomaterials
  • Energy materials
  • Geoscience
  • Chemistry
  • Nanotechnology
  • Condensed matter physics
  • Electronic excitations of strongly correlated electron systems
  • Functional materials
  • Photovoltaic materials
  • Electron-correlated materials
  • Low dimension materials

General Information

  • Source: 1.7-11keV
  • Energy Range: 0.3*0.62 mm2 (Micro-beam: 5*5 μm2)
  • Focused Spot Size: 0.3*0.62 mm2 (Micro-beam: 5*5 μm2)
  • Status: Under Construction

National Synchrotron Radiation Research Center

101 Hsin-Ann Road, Hsinchu Science Park, Hsinchu, Taiwan 30076